高温操作寿命HTOL及早期失效EFR计算公式

高温操作寿命HTOL及早期失效EFR计算公式

早期失效寿命试验 Test conditions: Stress Voltage VA= 3.3 TA= 125 Stress Temperature KA= 398 Test duration tA= 72 Sample size N= 3000 Activation Energy Ea= 0.7 γV= 1 k= 8.62E-05 AF=AFt*AFv = 128.50295 AFt = exp [(Ea/k) * (1/Kuse – 1/KA)] = 77.9409788 AFv= exp [(K/X) * (VA – Vuse)] = exp [γV * (VA – Vuse)] = 1.64872127 60% Confidence Level Result: Confidence Level(%) = 60% Total Rejects(r) = 0 X^2(%CL,2r+2)= = 1.83258146 λ=[X^2(%CL,2r+2)*10^9]/2*AF*tA*N = 33.0115903 = 30292391 MTTF=1/λ*10^9 = 3458.0355 ELFR (in ppm per tELF) = [tELF × 10-3 × ELFR in FIT] = 289.181531 Test Sample:1000pcs/3lot(3 non-sequential) V ℃ K hours pcs eV V-1 eV/K

FITS Device Hours Device Years ppm

Test Sample：1000pcs/3lot(3 non-sequential)

高温操作寿命HTOL及早期失效EFR计算公式

失效寿命试验 Use conditions: Normal Operating Voltage Normal Operating Temperature Early life period

Vuse= Tuse= Kuse= tELF=

2.8 55 328 8760

V ℃ K hours

90% Confidence Level Result: Confidence Level(%) Total Rejects(r) X^2(%CL,2r+2)= λ=[X^2(%CL,2r+2)*10^9]/2*AF*tA*N MTTF=1/λ*10^9

= = = = = =

90% 0 4.60517019 82.9561983 FITS 12054554.3 Device Hours 1376.09068 Device Years